Testing - recognize and act

The classic method of visual inspection by the human eye had its day.

For this task, we have an extensive portfolio in the house:

• Automatic Optical Inspection (AOI)

• In-Circuit-Test (ICT)

• Functional Test Systems (MFT)

• In Run / Burn In tests

• Accelerated Stress Test (AST)

Automatic Optical Inspection  (AOI):

9 cameras per AOI system will automatically analyze components and solder joints. The results are stored in a database and analyzed to improve the processes.

In-Circuit-Test (ICT):

In-Circuit tester test modules electronically. The specifications of components are verified. It allows for testing whole circuit blocks (clusters) as well as programming of microcontrollers and programmable logic devices.

The ICT systems have the following advantages:

• Fast testing
• Both digital and analog stimulation and measurement is possible

Function Test Systems (MFT):

With multifunction measurement systems (MFT)  the specimen is  connected to the test system using an adapter to its "natural" interfaces. These interfaces simulate the subsequent application . An extensive functional test of the complete system is carried out.

In Run / Burn-in tests:

To detect early failures, test samples are stress tested, mostly under full load and over a longer period. Defined temperature and / or load cycles are traversed.

Accelerated Stress Test (AST):

The correct product design and complete production quality are confirmed by the AST method.

• Product Design: HALT - Highly Accelerated Life Testing
• Production quality:
  HASS - Highly Accelerated Stress Screening